![]() An Automated EBSD Acquisition and Processing System P. Hardware and Software Optimization for Orientation Mapping and Phase Identification P.P. Automated Electron Backscatter Diffraction: Present State and Prospects R.A. Three-Dimensional Orientation Imaging D.J. Phase Identification Using Electron Backscatter Diffraction in the Scanning Electron Microscope J.R. Studies on the Accuracy of Electron Backscatter Diffraction Measurements M.C. Rodriques-Frank Representations of Crystallographic Texture K. Representation of Texture in Orientation Space K. Theoretical Framework for Electron Backscatter Diffraction V. The Development of Automated Diffraction in Scanning and Transmission Electron Microscopy D.J. ![]() The new developments covered in this book include a more comphrensive coverage of the fundamentals not covered in the first edition or other books in the field, the advances in hardware and software since the first edition was published, and current examples of application of electron backscatter diffraction to solve challenging problems in materials science and condensed-matter physics. The text has been substantially revised from the first edition, and the authors have kept the format as close as possible to the first edition text. The purpose of this book is to provide the fundamental basis for electron backscatter diffraction in materials science, the current state of both hardware and software, and illustrative examples of the applications of electron backscatter diffraction to a wide-range of materials including undeformed and deformed metals and alloys, ceramics, and superconductors. Electron backscatter diffraction is a very powerful and relatively new materials characterization technique aimed at the determination of crystallographic texture, grain boundary character distributions, lattice strain, phase identification, and much more. Providing the fundamental basis for electron backscatter diffraction in materials science, this book analyzes the current state of both hardware and software, and gives examples of applications of electron backscatter diffraction to a wide-range of materials. Field, DavidÄ®lectron backscatter diffraction is a very powerful and relatively new materials characterization technique aimed at the determination of crystallographic texture, grain boundary character distributions, lattice strain, phase identification, and much more. EBSD is a relatively new analytical capability that allows geologists to test existing nucleation, growth, and deformation models for minerals and rocks, and to develop new ones.Electron Backscatter Diffraction in Materials Science Electron Backscatter Diffraction in Materials Science Among other uses, these data may be applied to evaluate crystallographic preferred orientations (CPO) of mineral fabrics, and to examine misorientation axes and angles that may signify processes such as subgrain development and dislocation creep. The scanning and mapping capabilities of the system permit rapid acquisition of data from polished rock thin sections at sub-micron resolutions. Analysis of the diffraction pattern of backscattered electrons from crystalline materials allows identification of phase and its crystal lattice orientation. The EBSD will be installed on an existing modern scanning electron microscope (SEM) equipped with an energy-dispersive spectrometer (EDS) in the Department of Geology at Bowdoin College. Primary Place of Performance Congressional District:Ä 320871 Beane This Major Research Instrumentation (MRI) Program grant supports the acquisition of an electron backscattered diffraction system (EBSD), provides limited PI salary support and travel costs associated with instrument training, and supports the acquisition of related consumables, sample preparation equipment and software. Rachel Beane (Principal Investigator) Sponsored Research Office:.Russell Kelz (703)292-4747 EAR Division Of Earth Sciences GEO Directorate For Geosciences Acquisition of an Electron Backscatter Diffraction System NSF Org:
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